ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,436,779, issued on Oct. 7, was assigned to SAP SE (Walldorf, Germany). "Interactively extending machine-learning-generated rules and recommendat... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,438,846, issued on Oct. 7, was assigned to THALES (Courbevoie, France). "Open world communication device for communicating with an avionics syst... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,434,250, issued on Oct. 7, was assigned to Energy & Environmental Research Center (Grand Forks, N.D.). "Method of forming graphene quantum dots ... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,439,460, issued on Oct. 7, was assigned to LENOVO (BEIJING) Ltd. (Beijing). "Data transmission method and device" was invented by Jianfeng Wang ... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,434,130, issued on Oct. 7, was assigned to Lovevery Inc. (Boise, Idaho). "Separable assembly" was invented by Thomas Creason Rigby (Boise, Idaho... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,438,498, issued on Oct. 7, was assigned to KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS (Dhahran, Saudi Arabia). "Photovoltaic panel air spray... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,437,958, issued on Oct. 7, was assigned to Hitachi High-Tech Corp. (Tokyo). "Electron beam application device" was invented by Takashi Ohshima (... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,439,780, issued on Oct. 7, was assigned to Samsung Display Co. Ltd. (Yongin-si, South Korea). "Display apparatus" was invented by Sungjae Moon (... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,435,429, issued on Oct. 7, was assigned to Hahn-Schickard-Gesellschaft fur Angewandte Forschung e. V. (Villingen-Schwenningen, Germany). "Electr... Read More
ALEXANDRIA, Va., Oct. 8 -- United States Patent no. 12,438,056, issued on Oct. 7, was assigned to FUJI ELECTRIC Co. LTD. (Kawasaki, Japan). "Semiconductor device and method for determining deteriorat... Read More